Search results for "scattering [p nucleus]"

showing 10 items of 198 documents

Porous inorganic–organic hybrid material by oxygen plasma treatment

2011

In this paper, we present the pore formation on inorganic–organic hybrid material, ORMOCER©, by reactive ion etching. ORMOCERs are composed of inorganic backbone where organic side groups are attached by cross-linking. Etching of ORMOCER in oxygen plasma generates porous materials with different pore sizes depending on the etching parameters. In addition to planar films, this pore formation process is applicable to micro and nanostructures. Characteristics of porous materials are evaluated by contact angle measurement, scanning electron microscopy, Fourier transform infrared-attenuated total reflectance spectroscopy, time-of-flight elastic recoil detection analysis and Rutherford backscatte…

Materials scienceMechanical Engineeringtechnology industry and agricultureAnalytical chemistryRutherford backscattering spectrometryElectronic Optical and Magnetic MaterialsChemical engineeringMechanics of MaterialsSputteringEtching (microfabrication)Electrical and Electronic EngineeringThin filmReactive-ion etchingPorous mediumHybrid materialPlasma processingJournal of Micromechanics and Microengineering
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Microwave characterization and modeling of packaged HEMTs by a direct extraction procedure at cryogenic temperatures

2004

In the present work we employ a direct extraction procedure to determine small signal equivalent circuit of microwave GaAs FETs by means of scattering (S-) parameter measurements down to cryogenic temperatures. The direct extraction procedure was tested on packaged AlGaAs/InGaAs HEMTs and good agreement between the simulated and measured S-parameters was obtained at different bias and temperature conditions. We employed a properly designed cryogenic set-up operating in our laboratory that allows to perform DC and RF characterization down to 30 K.

Materials scienceMicrowave Characterization Small Signal Modeling Low-Noise Devices Cryogenic Temperatures Cold FET.Scatteringbusiness.industryExtraction (chemistry)CryogenicsCondensed Matter::Mesoscopic Systems and Quantum Hall EffectSignalGallium arsenidechemistry.chemical_compoundchemistryScattering parametersEquivalent circuitOptoelectronicsbusinessMicrowave
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Self-assembled silver nanoparticles for plasmon-enhanced solar cell back reflectors: correlation between structural and optical properties

2013

The spectra of localized surface plasmon resonances (LSPRs) in self-assembled silver nanoparticles (NPs), prepared by solid-state dewetting of thin films, are discussed in terms of their structural properties. We summarize the dependences of size and shape of NPs on the fabrication conditions with a proposed structural-phase diagram. It was found that the surface coverage distribution and the mean surface coverage (SC) size were the most appropriate statistical parameters to describe the correlation between the morphology and the optical properties of the nanostructures. The results are interpreted with theoretical predictions based on Mie theory. The broadband scattering efficiency of LSPR…

Materials scienceMie scatteringSilver nanoparticlePhysics::OpticsPlasmonBioengineeringNanotechnologyScattering efficiency02 engineering and technologyStatistical parameterSettore ING-INF/01 - Elettronica01 natural sciences7. Clean energySilver nanoparticlelaw.inventionlawSurface coverage0103 physical sciencesSolar cellGeneral Materials ScienceDewettingElectrical and Electronic EngineeringThin filmPlasmon010302 applied physicsScatteringSurface plasmon resonance SilverMechanical EngineeringSolar cellStructural and optical propertieGeneral ChemistryLocalized surface plasmon resonance021001 nanoscience & nanotechnologyOptical propertiePhase diagramMechanics of MaterialsThin-film solar cells Nanoparticle0210 nano-technologySilver nanoparticle (NPs)Localized surface plasmon
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Characterization of semicrystalline random copolymers by small-angle neutron scattering

1979

A new method is introduced to determine the degree of partitioning of noncrystallizable comonomer units (B units) between the two phases of a semicrystalline random copolymer. The method is based on the comparison of the intensities of small-angle neutron and x-ray scattering (SANS and SAXS, respectively). By this technique two quantities can be evaluated: the difference Δρ of the mass densities between the crystalline and the disordered regions, and the concentration fluctuations of the B units in the two phases. It is found that SANS is very sensitive to the presence of small amounts of B units if their scattering length is sufficiently different from that of the A units. This will be the…

Materials scienceScatteringSmall-angle X-ray scatteringComonomerGeneral EngineeringAnalytical chemistryScattering lengthSmall-angle neutron scatteringCrystallinityCrystallographychemistry.chemical_compoundchemistryPhase (matter)CopolymerJournal of Polymer Science: Polymer Physics Edition
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Phonons of hexagonal BN under pressure: Effects of isotopic composition

2021

Raman scattering experiments on isotopically enriched hexagonal boron nitride have been performed under pressure up to 11 GPa at room temperature. The sublinear increase of the Raman-active E2g mode frequencies has been characterized. The pressure behavior has been analyzed by means of a bond-stiffness–bond-length scaling parameter γ which takes into consideration the vast differences in a- and c-axis compressibilities. The interlayer shear mode exhibits a γ parameter similar to that of graphite, and the mode frequency in isotopically pure samples separates faster at low pressures as a result of van der Waals interactions. Because of the extremely low a-axis compressibility, the intralayer …

Materials scienceSublinear functionPhonon02 engineering and technology01 natural sciencessymbols.namesakeRaman scattering experimentsCondensed Matter::Superconductivity0103 physical sciencesPhonomsGraphite010306 general physicsScalingCondensed matter physicsPhysical Systems021001 nanoscience & nanotechnologyTechniquesSemiconductorsRaman spectroscopyCompressibilitysymbolsvan der Waals forceGraphene0210 nano-technologyRaman spectroscopyRaman scattering
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TEMPERATURE DEPENDENT NOISY MODELS OF PSEUDOMORPHIC HEMTs

1994

From a complete characterization in terms of noise and scattering parameters carried out at room temperature in the 8–16 GHz frequency range, the noisy small‐signal model of a pseudomotphic HEMT series has been extracted. The transistor scattering parameters have been subsequently measured at lower temperatures (down to −50 °C) by placing the device text fixture in a thermo‐controlled chamber. The model effectiveness has then been tested by determining the circuit element values at the different temperatures and by observing the model noise performance.

Materials sciencemicrowaveSeries (mathematics)business.industryApplied MathematicsTransistorHigh-electron-mobility transistorFixtureNoise (electronics)noise modelsComputer Science Applicationslaw.inventiontemperature-dependentComputational Theory and MathematicsHEMT; noise models; microwave; temperature-dependentlawRange (statistics)Scattering parametersElectronic engineeringOptoelectronicsElectrical and Electronic EngineeringbusinessHEMTCOMPEL - The international journal for computation and mathematics in electrical and electronic engineering
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Variation of lattice constant and cluster formation in GaAsBi

2013

We investigate the structural properties of GaAsBi layers grown by molecular beam epitaxy on GaAs at substrate temperatures between 220–315 C. Irrespective of the growth temperature, the structures exhibited similar Bi compositions, and good overall crystal quality as deduced from X-Ray diffraction measurements. After thermal annealing at temperatures as low as 500 C, the GaAsBi layers grown at the lowest temperatures exhibited a significant reduction of the lattice constant. The lattice variation was significantly larger for Bi-containing samples than for Bi-free low-temperature GaAs samples grown as a reference. Rutherford backscattering spectrometry gave no evidence of Bi diffusing out o…

Materials scienceta114Annealing (metallurgy)Analytical chemistryGeneral Physics and Astronomyion beam analysisoptoelektroniikkaRutherford backscattering spectrometryCrystallographic defectCrystalLattice constantTransmission electron microscopyX-ray crystallographyMolecular beam epitaxyJournal of Applied Physics
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Nucleation and growth of ZnO on PMMA by low-temperature atomic layer deposition

2015

ZnO films were grown by atomic layer deposition at 35 °C on poly(methyl methacrylate) substrates using diethylzinc and water precursors. The film growth, morphology, and crystallinity were studied using Rutherford backscattering spectrometry, time-of-flight elastic recoil detection analysis, atomic force microscopy, scanning electron microscopy, and x-ray diffraction. The uniform film growth was reached after several hundreds of deposition cycles, preceded by the precursor penetration into the porous bulk and island-type growth. After the full surface coverage, the ZnO films were stoichiometric, and consisted of large grains (diameter 30 nm) with a film surface roughness up to 6 nm (RMS). T…

Materials scienceta114Scanning electron microscopeAnalytical chemistryNucleationthin film growthCrystal growthSurfaces and InterfacesCondensed Matter PhysicsRutherford backscattering spectrometrySurfaces Coatings and FilmsElastic recoil detectionCrystallinityAtomic layer depositionSurface roughnessta116zinc oxide filmsJournal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
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Fixed angle inverse scattering in the presence of a Riemannian metric

2020

We consider a fixed angle inverse scattering problem in the presence of a known Riemannian metric. First, assuming a no caustics condition, we study the direct problem by utilizing the progressing wave expansion. Under a symmetry assumption on the metric, we obtain uniqueness and stability results in the inverse scattering problem for a potential with data generated by two incident waves from opposite directions. Further, similar results are given using one measurement provided the potential also satisfies a symmetry assumption. This work extends the results of [23,24] from the Euclidean case to certain Riemannian metrics.

Mathematics - Differential GeometryWork (thermodynamics)01 natural sciencesinversio-ongelmatFixed angleMathematics - Analysis of PDEsIncident waveEuclidean geometryFOS: MathematicssirontaUniqueness0101 mathematicsinverse medium problemPhysicsosittaisdifferentiaaliyhtälöt35Q60 35J05 31B10 35R30 78A40Applied Mathematics010102 general mathematicsMathematical analysisCarleman estimatesRiemannian metricsSymmetry (physics)010101 applied mathematicsfixed angle scatteringDifferential Geometry (math.DG)Metric (mathematics)Inverse scattering problemAnalysis of PDEs (math.AP)
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12C + 12C large angle elastic scattering at 240 MeV

2010

Abstract The measurement of the differential cross sections of the 12C + 12C and the 13C + 12C elastic scattering are carried out at the 12C energy 240 MeV and the 13C energy 250 MeV to solve some interpretation problem of the 12C + 12C scattering data. Is it possible that the 1st Airy minimum in 12C + 12C scattering data is missing? Our analysis shows that the positions of the 1st Airy minima obtained in former measurements are confirmed.

Maxima and minimaPhysicsElastic scatteringNuclear and High Energy PhysicsPhonon scatteringScatteringScattering lengthScattering theoryAtomic physicsInelastic scatteringSmall-angle neutron scatteringNuclear Physics A
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